Used BRUKER-AXS Dektak XT #9282889 for sale

BRUKER-AXS Dektak XT is a wafer testing and metrology equipment used for automated quality control and statistical process control of silicon wafers. BRUKER-AXS DEKTAKXT is an essential tool for the efficient manufacturing of high-precision wafers in the semiconductor industry. The advanced technology of Dektak XT offers quick and accurate measurements of wafer coating cross section profiles, topography, and surface roughness. DEKTAKXT is a multi-functional metrology tool designed for obtaining detailed information about the surface of wafers. The automated system utilizes an ultra-high accuracy, non-contact, vertical scanning, and interference-free profiling unit to measure the topography, cross section profile, and surface roughness of both bare and coated wafers. The topography readings are taken using a Contour Technology optical profilometer with extraordinary sensitivity, optional interlocks and sample data loggers. BRUKER-AXS Dektak XT is equipped with advanced optoelectronic components that ensure the highest quality results with precision ranging from 0.1nm to 10µm. BRUKER-AXS DEKTAKXT provides quality assurance by acquiring and quantifying wafer coatings and material deposition on the surface and near the edges of the wafer. Dektak XT also implements a non-destructive testing (NDT) process that eliminates the need for sample destruction—thereby reducing production costs. DEKTAKXT also offers a high degree of automation. It is equipped with a robotic load/unload machine and features real-time data acquisition, data archiving, and full-range plotting options. This makes it easy for its users to store, access, and compare data on previously tested wafers for quick analysis. BRUKER-AXS Dektak XT is the perfect solution for advanced wafer testing and metrology. It ensures accurate wafer testing, quality assurance, and cost-efficiency, making it the ideal choice for the semiconductor industry.