Used BRUKER NANO DektakXT #293653435 for sale

BRUKER NANO DektakXT is a state-of-the-art wafer testing and metrology system designed for optimum performance in semiconductor fabrication operations. It is capable of providing accurate and reliable measurements for a multitude of applications, such as semiconductor process control and analysis, process development and failure analysis. DektakXT incorporates an onboard CCD camera and digital signal processor (DSP) for high-resolution optical measurements. With these components, BRUKER NANO DektakXT is able to take accurate, repeatable measurements of a wide range of features on a wafer surface. It can measure lines, trenches, vias, bumps, and other features with an error-free accuracy of 0.1µm (0.000004"). The measurement results are measured in four modes: segmentation, ranging, imaging, and probing. Furthermore, DektakXT's motorized XY stages allow for fully automated scanning and repeatable measurements. BRUKER NANO DektakXT is integrated with the industry-recognized SmartScout software package. The software allows for easy path design and optimizes process parameters for improved yield and cost-efficiency. It also provides deep insights into the process performance through comprehensive statistical data analysis. Overall, DektakXT is an exceptionally reliable wafer testing and metrology system. Its low-noise operation and high resolution measurements offer a reliable solution to the needs of today's demanding semi-conductor industry. The system is maximally efficient and ideal for high-precision, low-cost production and testing. With the onboard CCD camera and DSP, it offers unparalleled precision and accuracy. Additionally, the SmartScout software allows for optimization of process parameters and in-depth data analysis for improved performance.