Used BRUKER / VEECO Contour GT-X #293586435 for sale

BRUKER / VEECO Contour GT-X is a leading wafer testing and metrology equipment for top-down measurements of wafers up to 200mm. If offers highly accurate and repeatable measurements in various analysis modes, such as surface profilometry, cavity depth analysis, step height analysis, wear patterns analysis, and gap analysis. VEECO Contour GT-X features an impressive scanning mechanism which utilizes both 2D and 3D scanning modes to achieve very precise and repeatable measurements. It offers a large sample-size range of 6 - 200mm and offers a fast data capture with up to 2 inspection cycles per second. The system features five-axis movement of the wafer with high-precision positioning, as well as a fully enclosed sample chamber, offering a safe and clean environment for the measurements. The optical microscope located on BRUKER Contour GT-X can also operate in up to four different magnifications, and is highly temperature-stable for better accuracy in measurements. Contour GT-X is also fitted with a vibration-isolated cutting deck and a motorized rotary table, enabling scanning of chamfers and stepped structures with a 0.1-degree angular accuracy. In terms of metrology accuracy, the unit is capable of achieving resolution down to 0.8nm. Moreover, the machine also has advanced data analysis capabilities, offering real-time analysis of the data as it is collected, as well as advanced image processing algorithms for faster data analysis. The tool also has an intuitive user-interface with customizable setup, making it easy to use even for novice operators. Overall, BRUKER / VEECO Contour GT-X is a powerful wafer testing and metrology asset, capable of delivering highly accurate results with fast scanning and data capture. With its advanced features, intuitive user-interface, and cutting-edge metrology abilities, VEECO Contour GT-X is a model designed to help wafer manufacturers achieve the best results.