Used CANDELA TS 2100 #9394297 for sale

CANDELA TS 2100 is a high-speed wafer testing and metrology equipment. The system consists of a dual-beam laser scanning microscope, which can measure 10,000 points per second with sub-micron precision. CANDELA is appropriate for many applications, including measuring the thickness and flatness of IC wafers and other materials. CANDELA is capable of accurately measuring thickness down to 0.02 µm, which is essential for applications requiring sub-micron accuracy. The unit can also measure bowl variation, topography, absorption coefficient, layer composition, and other essential feature y for IC wafers. Additionally, users can process images with real-time video capabilities and faster data analyzing calculations, which helps facilitate understanding of process issues in the IC fabrication. CANDELA features a reliable split-level mounting machine that provides precise motion control. The high-speed microlithography tool requires minimal servicing, thanks to its excellent alignment and associated laser stability. This advanced asset also utilizes an autofocus feature that adjusts the focal plane during tests, ensuring accuracy. CANDELA model features an intuitive user interface. Data can be accessed quickly, and users can easily modify tests and create new protocols. Furthermore, the equipment processes data quickly and accurately. This leads to increased efficiency, as researchers have found that CANDELA can process data 8-10 times faster than conventional testing equipment. All in all, TS 2100 wafer testing and metrology system is a highly reliable, versatile, and efficient unit for wafer inspection. With CANDELA, users can achieve precise measurements quickly and easily, all while receiving clear visual data that improves understanding of the process. Properly used, CANDELA can significantly improve IC wafer production performance.