Used CANON IUC Meter for MPA 500 #293626985 for sale

CANON IUC Meter for MPA 500 is an advanced wafer testing and metrology equipment designed to measure the overall shape and electrical characteristics of semiconductor wafers with accuracy and precision. It is capable of imaging wafers down to the nanometer level and has a wide range of features for measuring defects or abnormalities. The system is equipped with a high-resolution, optical microscope and a confocal laser microscopy (CLM) to image and analyze the single-crystal structures of the wafers. The microscope can detect feature facets and analyze a diverse range of surface details, such as ridge edges and flat surfaces. The unit can also be used for electrical fault analysis, which employs the measurement of current-voltage (I-V) characteristic curves for the wafer. This allows for the detection and characterization of electrical defects, due to its ability to measure parameters such as breakdown voltages and charge injections. The MPA 500 also has an integrated wafer film thickness (WFT) machine, which enables to measure the thickness of the insulating film on the wafer. The laser capture WFT tool has a wide range of measurement capabilities, such as measuring the thickness in terms of nanometers, microns and mils. The asset also comes with a robotic wafer handling model, which allows for a automated loading and unloading of multiple wafers into and out of the equipment. The robotic system is made up of two conveyor belts that move the wafers from one station to the next. The unit has an advanced software, called the HyTools-DW, which is an automated data capture and analysis software for wafer testing and metrology. This allows for a greater degree of control over the testing process, as well as for easier generation of measurement reports. Finally, IUC Meter for MPA 500 includes a number of advance features, such as auto focus and auto planarization, which provide greater stability and accuracy when analyzing the wafer. The machine also contains an in-depth manual, which provides a comprehensive overview of the tool's features and functions. Overall, CANON IUC Meter for MPA 500 is an advanced wafer testing and metrology asset that provides high levels of accuracy and precision, as well as a variety of innovative features. With its wide range of capabilities and advanced software, it is an essential tool for characterizing and analyzing any type of semiconductor wafer.