Used CANON IUCM Light uniformity checker for MPA 500 #9218256 for sale
CANON IUCM Light uniformity checker for MPA 500 is a wafer testing and metrology system designed to quickly and accurately measure the light uniformity of wafers. The system consists of a light source, megapixel camera, and sensitive light measurement detectors. The light source is a monochromatic array of LEDs which can be programmed to specific angular and intensity settings. These settings allow the light to be shone onto the wafer at a variety of angles and with a controlled level of intensity, so the effect can be accurately measured. Additionally, the LED light sources are phosphorized, which results in an even and uniform light source. The megapixel camera captures the light emitted from the wafer during the test. This camera has high resolution and a wide dynamic range, meaning it is capable of accurately capturing and measuring the light uniformity of each wafer. The data is then processed for accuracy and transferred to the PC for further analysis. CANON IUCM Light Uniformity Checker utilizes sensitive light measurement detectors to accurately measure the output of the wafer under test. These detectors are sensitive to specific wavelengths and intensities of light, allowing for the measurement of light uniformity from a variety of sources. Finally, CANON IUCM Light Uniformity Checker is able to analyze and display data in both graphical and tabular forms. This data can be used to compare the light uniformity of different wafers and to supplement other tests. CANON IUCM Light Uniformity Checker is a highly-accurate, user-friendly system that is capable of providing essential information for wafer testing and metrology. It is designed to be reliable, efficient, and accurate, allowing it to accurately and quickly measure the light uniformity of wafers while providing invaluable data for further analysis.
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