Used CDE RESMAP 168 #9188716 for sale

ID: 9188716
Wafer Size: 8"
Vintage: 2010
Four points probe, 8" 2010 vintage.
CDE RESMAP 168 is an advanced wafer testing and metrology equipment from CDE Technologies, designed to facilitate fast and accurate wafer testing and metrology. The system utilizes a unique combination of active and passive precision motion-control technologies, along with a suite of scanning and imaging technologies. The unit has a resolution of up to 0.25 micrometers, and is capable of accurately measuring a full range of parameters, including surface irregularity, profile and other topographical characteristics, and even critical features such as overlay and critical dimension (CD) measurements. The patented RESMAP feature will bring the edge measurement technology and enables scan and profile measurement capabilities. The RESMAP feature can measure the shape of the wafer very precisely to a width of 0.0001 microns (1 femtometer). This proprietary technology allows for more accurate and precise measurements compared to traditional view field methods. The machine also includes advanced image processing with advanced color selectors, and automated AC/DC potential balance measurement and comparison. This means that RESMAP 168 can quickly determine whether a wafer is free from any potential contamination, making it ideal and reliable for measuring and checking purity. Finally, CDE RESMAP 168 features advanced and customisable automation and error-free workflow automation, to facilitate faster and more accurate detection and minimise false positives. This means that the tool can accurately detect wafers that have either been removed from the production floor, or have experienced a production fault, and quickly move onto other wafers for measurement. In short, RESMAP 168 is an advanced wafer testing and metrology asset, which enables fast and precise wafer measurements, including surface irregularity, profile, overlay, CD measurements, and other critical features and parameters. With an extensive range of automation features, powerful image processing capability and reliable measurements down to the micrometer level, CDE RESMAP 168 is a highly reliable and automated solution for any wafer testing or metrology job.
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