Used CDE RESMAP 178 #293760286 for sale

CDE RESMAP 178 is a wafer testing and metrology equipment specifically designed for advanced semiconductor device research. It combines an advanced optical wafer measurement system with a dedicated silicon wafer test setup. The unit enables excellent resolution in both the lateral and vertical planes, at lateral resolutions up to 1μm. The machine is equipped with a CCD camera unit that can perform simultaneous measurements of both top and bottom surfaces of a wafer with a single image, enabling instant comparison of 2D surface structures in a wide range of applications. The tool is highly adaptable, and can be used for test measurements on various samples, such as engineered substrates, substrates with different materials, and multiple types of substrates with several sizes. The asset can measure a large range of parameters, including nominal film thickness, deposition pattern definition, surface morphology, uniformity, coercivity, resistance, tunability, capacity, and fatigue. It also incorporates built-in algorithms such as monitoring, averaging, and tracking, which facilitate wafer surface profile analysis. The model is also equipped with an advanced electrostatic discharge (ESD) protection equipment, offering superior protection against voltage discharge events which can occur during deep analyses, tests, and measurements. Additionally, the ESD protection system includes opto-isolated output channels and a steady-state Discharge Isolator (DSI) for personnel protection during experimentation. For improved accuracy, the unit is equipped with five adjustable laser sensors, which are capable of accurate measurements of both top and bottom surfaces of a wafer. It utilizes a high-precision laser interferometer which allows it to take high-definition and high-precision measurements across the entire surface of a wafer. Furthermore, the machine is easily integrated with users' existing test setups and other devices, offering flexibility and easy setup. All in all, CDE RESMAP178 wafer testing and metrology tool is a powerful and reliable tool for advanced semiconductor device research. It offers high-precision measurements across a wide range of sample types, and can be easily integrated with existing test setups, making it a highly adaptable and customizable tool.