Used CDE RESMAP 273 #293751606 for sale

CDE RESMAP 273 is a wafer testing and metrology equipment designed specifically for researchers, universities and other industrial environments. It offers automated testing, metrology and image processing capabilities to enhance the accuracy and speed of various semiconductor device studies. The main working platform is a multi-layer optical simulation (MOLS) stage which is coupled to the mapping software. The MOLS contains a series of stages which allow precise positioning of the device with micron level accuracy. This controller allows the user to precisely test devices across the wafer surface and to obtain fine resolution images with high accuracy. RESMAP 273 also provides a range of other testing options including: electrical testing, photoluminescence imaging, 3D elemental analysis and many more. Electrical testing is used to identify potential crystalline defects and includes features such as on-wafer non-destructive current/voltage measurements with precise delay control, leakage current testing and breakdown measurement. The photoluminescence imaging system can be used for inspecting the device for defects. The 3D elemental analyzer enables users to analyze the chemical composition of their device using a combination of high resolution imaging and energy dispersive x-ray spectroscopy (EDS). CDE RESMAP 273 also offers image processing capabilities which enable users to identify device characteristics, such as line widths, resolution, feature size and other device properties. These capabilities enable researchers to obtain detailed characterization information and to gain a better understanding of their device. RESMAP 273 is also designed to provide superior accuracy and speed compared to other wafer testing systems on the market. Its range of integrated features, such as automated wafer positioning and fast readout speeds, ensures the maximum accuracy and consistency when measuring the properties of a device. This unit is further supported by a range of tutorials which enable new users to quickly get to grips with the RESMAP and to start obtaining accurate results within a short period of time. Overall, CDE RESMAP 273 is an extremely versatile machine which ensures fast analysis and precise results when measuring materials and devices. This tool provides researchers with the tools they need to obtain detailed information and to gain a better understanding of their device.