Used CDE RESMAP 463 #293636674 for sale

CDE RESMAP 463 is a wafer testing and metrology equipment. It is a fully automated system designed to quickly verify wafer quality and detect wafer defects. It operates by scanning the top and backside surfaces of a wafer and analyzing the signals to create a defect map of the wafer surface. The unit is highly sensitive and allows for the detection of very small defects as small as 0.1 microns. RESMAP 463 consists of a main unit, a mini-probe station, a projector, a micro-manipulator stage, optical imaging equipment, and a wafer table. The main unit is responsible for controlling the various components of the machine. It is programmed with sophisticated metrology software that can detect and locate a wide range of defects, including particulates and scratches. The mini-probe station is equipped with two microscopes which allow for high magnification imaging. The projector is used for illuminating the wafer surface and for detecting any defects that may exist. The micro-manipulator stage is used to scan the wafer and accurately detect potential defects. The optical imaging equipment is responsible for capturing digital images of the wafer surface which can be further analyzed using the main unit's software. Lastly, the wafer table is used to mechanically translate the wafers during scanning. CDE RESMAP 463 offers a high degree of accuracy and precision, with a resolution of up to 10 nanometers. It is also equipped with sophisticated cooling systems to ensure the optimal performance of the sensitive components. The tool has an automated calibration asset which requires minimal user intervention. Additionally, the model is highly user-friendly and can be programmed to meet specific requirements. Overall, RESMAP 463 is an efficient and versatile wafer testing and metrology equipment. It offers great speed, accuracy, and precision and is suitable for a wide variety of applications. The system is designed to save time, money and resources and is an economical solution for any laboratory or manufacturing process requiring accurate and reliable wafer testing and metrology.