Used CHAPMAN MP2000+ #9361806 for sale

CHAPMAN MP2000+ is an advanced wafer testing and metrology equipment. It is designed to accurately measure and characterize sub-micron features on wafers, as well as providing a variety of other essential measurements and tests. The system is fully automated and integrates state-of-the-art imaging, metrology, and sample handling systems. The ultra-precise advanced motion platform can quickly and accurately characterize minute features on a variety of substrates, including photomasks and wafers. MP2000+ utilizes a 4-axis positioning stage to quickly and accurately position the measurement coordinates over the top of the wafer. This drive unit is driven by a geometric and overlaid grating scales, allowing for extremely precise alignment and positioning of the wafer for each individual measurement. Laser interferometers are used to provide accurate position feedback and brake correction for the XYZ positioning stage machine, enabling sub-micron resolution and repeatability for every test. The tool also contains a high-resolution microscope imaging asset which enables the user to visualize the features on the wafer in real-time, providing a detailed look at the layout and structure of the wafer. The microscope's CCD camera detects light emitted from the wafer surface and displays the image on the monitor for immediate viewing and manipulation. Moreover, CHAPMAN MP2000+ has a powerful 20W laser interferometer for measuring, stitching and measuring micro-structures. This powerful detection model ensures the highest accuracy for each test, allowing for sub-micron detection and analysis of features on the wafer. Additionally, the built-in 20W laser excitation equipment allows the user to detect and measure additional surface features, such as bumps, scratches, or corrosion. Finally, the system features high-speed data acquisition and processing, with an intuitive graphical user interface and built-in analysis tools. This provides the user with instant results, allowing for detailed process control and real-time insights into the wafer performance. In summary, MP2000+ is a powerful wafer testing and metrology unit designed for use in semiconductor manufacturing. It integrates advanced motion, imaging, metrology and sample handling technology for the most precise wafer measurements. The laser excitation and interferometer systems provide unparalleled accuracy and resolution, while the data acquisition and graphical user interface enable instant test results and real-time process control.