Used CHAPMAN MP2000+ #9394595 for sale

CHAPMAN MP2000+ is an advanced metrology and wafer testing equipment developed by CHAPMAN Engineering for a wide range of applications in the semiconductor industry, such as wafer testing, sample monitoring, and laboratory research. The system offers an efficient high-resolution solution to measure the features of the semiconductor wafers during the fabrication process. The unit consists of a fully automated stage combined with sophisticated hardware and software components. It also includes a high-resolution CCD sensor for accurate image capture. The machine features powerful image-processing capabilities to deliver superior test results. It's equipped with a high-speed motorized wafer chuck to ensure precise sample mapping, alignment, and registration. In addition to these features, the tool also benefits from advanced software algorithms to allow for accurate metrology and wafer testing of multiple sample types. MP2000+ is designed to withstand difficult environmental conditions, including temperature fluctuations, humidity, and air pollution. This ensures reliable sampling in the field and in production settings. The large working area of the asset makes it well suited for even the most demanding wafer testing requirements. The model is equipped with advanced scanning software, which includes 3D edge detection, particle image analysis capabilities, and powerful statistical analysis tools. This allows for detailed analysis of data, as well as the generation of reports documenting the wafer's performance. The software also provides users with comprehensive graphical output, which can be customised to include graphical results obtained by the user's own analysis or post-processing. CHAPMAN MP2000+ is an ideal solution for a wide range of wafer testing applications, as it offers a combination of reliability, accuracy, and flexibility. Its high-resolution CCD sensor and powerful image-processing capabilities make it an ideal equipment for applications which require a high degree of accuracy in wafer testing. Furthermore, its fully automated stage and software algorithms offer high throughput and flexibility, which is often needed for demanding wafer testing requirements.