Used CHAPMAN MPT 1000 #9307701 for sale

CHAPMAN MPT 1000 Wafer Testing and Metrology Equipment is a versatile and powerful tool for manufacturers of semiconductor devices. It is designed to provide accurate, real-time data for quality control processes on the production line. With MPT 1000 system, manufacturers can automate the process of physical material characterization and defect analysis. The highly accurate and precise optical testing platform offers superior performance for the inspection of thin wafers, substrates and other active devices. CHAPMAN MPT 1000 optical unit uses two objectives to collect microscope image data of the wafer surface. With the first objective, low-magnification photos are captured of the entire wafer; these images are used for wafer alignment and alignment verification during yield testing. The second objective is used to capture higher magnification images of selected areas for more detailed analysis of defects. The optical machine also includes a peripheral array of high-precision tilt sensors and two micromanipulators to allow precise adjustment of the sample position. The main component of MPT 1000 tool is its computer controller, which performs measurements and calculations for wafer testing and metrology. The controller can be programmed to customize the sequence of movement and measurement. Additionally, the computer asset has an automated defect recognition program that can detect and classify eddy current or opto-mechanical defects. This allows rapid analysis of process fragments and large-scale multiple electrical strikes. CHAPMAN MPT 1000 model also offers a wide variety of optional functions for flexibility and accuracy, including high-intensity autofocus, image scaling, and single-step drift compensation. This allows the equipment to work with a variety of different wafer sizes and parameters. Additionally, MPT 1000 includes a software suite with advanced tools for quality optimization and performance analysis. It includes a web-based user interface for easy configuration and setup of the system, and a graphical user interface to monitor the unit in real-time. Overall, CHAPMAN MPT 1000 Wafer Testing and Metrology Machine is a powerful and highly accurate tool for wafer testing and metrology. With its advanced optics and computer tool, it allows users to quickly and accurately diagnose and analyze physical defects on the production line. Its features can also be used to analyze process results for quality assurance and performance optimization. Its versatile and customizable features, user-friendly interface, and comprehensive software suite make it the ideal solution for manufacturers of semiconductor devices.