Used COHERENT LaserCam-HR #293609595 for sale

COHERENT LaserCam-HR is an automated wafer testing and metrology equipment that enables accurate measurements of wafers and other thin objects. It provides high-resolution imaging and measurement capabilities through a combination of laser and digital imaging. Specifically, the system utilizes a passively-stabilized Q-switched laser for illumination and large-format, Peltier-cooled interline transfer CCD (charge-coupled device) imaging for photogrammetry. LaserCam-HR unit's advanced architecture enables it to achieve micron-level accuracy and repeatability with resolutions as low as 1/2 micron - ideal for today's high-accuracy wafer measurements. The high-accuracy laser-assisted imaging itself is accomplished in a real-time, automated manner, thanks to the machine's high-speed galvanometer scanner. The scanner moves the laser-beam across the wafer surface in a programmed pattern, enabling high-resolution images to be acquired. This imaging process supports a variety of advanced functions including surface profile and feature measurements, flux metrology, and imaging defect inspection. The tool includes a variety of other advanced features that further enhance its performance. These include wafer tracking, precise beam-power control, advanced sample-measurement algorithms, and re-measurement capability. This wide range of features makes the asset particularly well-suited for precise, automated measurements on a variety of wafer substrates. COHERENT LaserCam-HR model also boasts an impressive list of post-processing features. These include a library of scriptable measurement templates, an extensive statistics package, and an integrated report generation equipment. Additionally, the system can be easily integrated into existing systems and workflows through its industry standard interfaces. Overall, LaserCam-HR is a highly-capable, accurate and reliable unit for measuring wafers and other thin objects. Its advanced features, high-resolution imaging capabilities and post-processing options combine to make it an ideal solution for today's wafer testing and metrology needs.