Used DAGE (Wafer Testing And Metrology) for sale

DAGE, a well-known manufacturer in the field of electronic testing and inspection equipment, offers a wide range of wafer testing and metrology equipment. These systems play a crucial role in ensuring the quality and reliability of semiconductor wafers used in various industries. DAGE's wafer testing units, such as the 400 PAX-1, are designed to detect defects and anomalies on wafer surfaces. They utilize advanced imaging technologies, including optical, electron, and X-ray microscopy, to provide high-resolution images for accurate defect identification. These machines offer precise positioning capabilities, allowing users to inspect specific areas of interest on the wafer. In terms of metrology tools, DAGE offers the CVP 21, a versatile and user-friendly tool that enables dimensional measurements of bump, pad, and solder joint heights. It utilizes non-contact vision inspection techniques, including laser scanning and high-resolution cameras, to achieve accurate and repeatable measurements. These metrology assets are essential in assessing the quality and reliability of solder joints and interconnects in electronic devices. The main advantages of DAGE's wafer testing and metrology models lie in their high accuracy, speed, and reliability. They enable efficient defect detection and measurement, ensuring that only wafers meeting the required quality standards are used in production. The equipment are also user-friendly, featuring intuitive interfaces and automated functionalities that enhance productivity and reduce operator errors. Some examples of DAGE's wafer testing and metrology systems, in addition to the aforementioned 400 PAX-1 and CVP 21, include the 4000Plus Bondtester and the XD7600NT Diamond X-ray Inspection System. These units cater to different needs and requirements in the semiconductor industry, providing comprehensive solutions for wafer inspection, defect analysis, and metrology.