Used DAVIDSON D 665-107 #293610069 for sale

DAVIDSON D 665-107 is a wafer testing and metrology equipment used for measuring semiconductor device parameters. It provides automated measurements of die, wafer-level, and active and passive components in a range of materials like silicon, germanium, and gallium arsenide. It has automatic edge detection and a built-in library of geometries with a range of test points. The system also incorporates an optical monitoring unit, allowing it to measure dimensions and perform automatic placement optimization. The machine is designed to work in a wide range of semiconductor process and measurement conditions, with low noise and thermal management to reduce losses and unwanted parasitic heating. It offers high speed wafer mapping for large and small device comparison. The tool uses a wavelength scatterometry (SWS) wafer metrology asset to acquire the positions and shapes of each device, as well as material parameters and global patterning. The model includes two-axis scanned imaging and phase-shifted white light interferometry (PSWLI) for profile measurement, allowing it to measure a variety of parameters such as local feature data, profile data, and overall features. It also provides advanced analysis of device parameters such as surface roughness, profile error, and material property. The equipment is designed for automated wafer handling, and can be integrated with other tools and equipment, including automated prober and handler, automatic probe movement, and printing solutions. It offers non-contact wafer inspection and ultra-precision measurement capabilities. The system is combined with specific software packages, offering different connectivity solutions. D 665-107 can also be used for rapid prototyping and rapid development, with a high accuracy and resolution. It is equipped with several embedded systems, including a DRAM, flash, and application-specific logic to ensure efficient operation. The unit benefits from intelligent control techniques ensuring reliable and fast results, even in challenging environments. With its specialized metrology capabilities, the machine is a powerful and dependable tool used to accurately measure a wide range of materials with the highest accuracy.