Used DEKTAK 3ST #293644228 for sale

DEKTAK 3ST wafer testing and metrology equipment is the world's most reliable and accurate platform designed for measuring and inspecting surfaces. This system enables rapid and precise scanning of wafers for three-dimensional metrology with a data accuracy up to 0.5nm. It is built with a robust design that is engineered to outlast and outperform other systems on the market. The unit is equipped with a 5-axis probe head which provides dynamic positional accuracy up to 0.2µm over a 12mm range. This is used to collect data from each surface which is collected through multiple different scanning points. Each scan point is then represented as an array of data points stored in the machine for metrology analysis. This tool also has intuitive software that allows users to view the data in real-time, which helps to optimize the testing and inspection process. The asset offers users the ability to measure multiple different parameters, such as surface flatness, line width/spacing, profile, and step heights. These measurements are then used to report on defects such as scratches, particles, pinholes, and random surface defects. Users are also able to perform advanced surface analysis using prominent defect detection algorithms such as Otsu and Deflaker methods. 3ST wafer testing and metrology model is a versatile tool for inspecting and analyzing a variety of wafer surfaces. It provides accurate, reliable data in a short amount of time, which allows users to quickly identify defects and other irregularities. This equipment is the perfect choice for any user looking to measure the surface properties of wafers with accuracy and precision.