Used DEKTAK 3ST #293649566 for sale

DEKTAK 3ST is a wafer testing and metrology equipment designed for measuring dimensional, electrical, and mechanical characteristics of semiconductor wafers. Built by KLA-Tencor, 3ST uses contact stylus technology to accurately measure the surface structure of wafers while protecting them from damage. DEKTAK 3ST offers unparalleled accuracy and repeatability through its advanced stylus technology. Its laser-guided contact stylus probes contact the wafer surface point-by-point to accurately measure the wafer profile. The advanced optical mechanisms within the stylus reduce skidding while measuring, providing accurate measurements and protecting the wafer from damage. 3ST provides detailed analysis of a variety of wafer characteristics. For example, it is capable of measuring metrology features such as step heights, flatness, and the presence of unwanted particles and material. Additionally, it measures electrical properties such as sheet resistivity and sheet resistance. Finally, it performs mechanical measurements, including films thickness and Young's modulus of elasticity. DEKTAK 3ST is a user-friendly system with an intuitive graphical interface and keyboards. An integrated, high-resolution monitor displays the measurements and test results, and a user-defined alarm can be set to indicate when an anomaly is detected. Additionally, data from 3ST can be easily exported via Ethernet and FireWire connections for further analysis. DEKTAK 3ST is an extremely reliable unit; it is designed to maintain its precision and accuracy over long periods of use, and is covered by a comprehensive warranty. 3ST is also very cost-effective: by using stylus technology, it eliminates the need for expensive equipment rentals and provides cost savings due to its long-term reliability. In summary, DEKTAK 3ST is a wafer testing and metrology machine designed to measure the dimensional, electrical, and mechanical characteristics of semiconductor wafers. Utilising advanced laser-guided contact stylus technology, it is extremely accurate and repeatable. The user-friendly interface, intuitive graphical display and export capabilities make it a great choice for semiconductor testing and metrology.