Used DNS / DAINIPPON CV-8000 #9269466 for sale

DNS / DAINIPPON CV-8000 is a wafer testing and metrology equipment designed to rapidly, accurately and cost-effectively perform wafer inspection and process control. The system includes a high-resolution wafer inspection tool, a metrology tool, and zone plate lithography software for local patterning. The high-resolution inspection tool allows users to quickly and accurately evaluate a wide range of parameters such as surface features, contaminants, and defects. The metrology tool offers an integrated data acquisition module with various optical components for precise metrology measurements. Additionally, the unit provides a high degree of flexibility for users wanting to tailor their parameters for a specific application. The wafer inspection tool features a unique optics machine that allows for high accuracy and resolution of 0.5 μm. Additionally, the tool offers automatic calibration, allowing for quick and easy setup. The integrated inspection process utilizes a CCD-based imaging tool that is capable of detecting particles, contaminants, voids, and surface features that affect wafer performance. In addition, it provides powerful automatic pattern recognition capabilities for a more intuitive analysis. The metrology tool features an integrated data acquisition module that includes laser interferometer, autocollimation, and contact surface measurement techniques. Moreover, it supports a wide range of metrology techniques such as small dynamic enhancement (SDE), temporal imaging scanning (TIS), power spectral density (PSD), and angle-sensitive spectral domain optical coherence tomography (AS-SDOCT). Furthermore, the asset supports both contact and non-contact scanning options for a wide range of applications. Finally, DNS CV-8000 comes with a unique zone plate lithography software for local patterning. The advanced software allows for micro-patterning of substrates, enabling users to create unique and complex shapes with high accuracy. Furthermore, the lithography software offers intuitive graphical user interface and manual pattern editing capabilities to ensure successful execution of patterning processes. In conclusion, DAINIPPON CV-8000 is a versatile wafer testing and metrology model designed to provide fast, accurate, and cost-effective wafer inspection and process control. The equipment features a high-resolution wafer inspection tool, a metrology tool with integrated data acquisition module, and a unique lithography software for local patterning. It is a powerful tool for ensuring effective and efficient wafer processing in semiconductor production.