Used DNS / DAINIPPON Lambda Ace VM-2200 #293664929 for sale

DNS / DAINIPPON Lambda Ace VM-2200 is a high-tech wafer testing and metrology equipment based on direct imaging technology. It is equipped with several advanced technologies that make it ideal for performing complex metrology tasks with a high degree of accuracy and repeatability. The VM-2200 features an innovative Direct Image Sensor (DIS) that provides superior imaging performance even with low light conditions. The DIS is composed of two independent optical heads that can be used to measure complex wafers with a high level of detail. The system provides accuracy up to 50nm (0.05um) for both 2D and 3D measurements. The unit supports a variety of automated image capture and analysis features that can be used to measure multiple targets quickly and accurately. It is also capable of performing fast automatic sorting and stacking operations to keep a variety of calibration and testing samples organized and categorized. The VM-2200 is powered by an advanced Data Processing Machine (DPS) that can analyze images in real time and provide detailed information on various parameters. The tool comes equipped with a suite of advanced algorithms that enable it to track multiple patterns on the wafer and determine the exact locations of the various points that need to be measured. The DPS can also be used to obtain a complete analysis of the wafer performance based on the measurements taken. The VM-2200 supports a variety of test applications and can provide the highest quality data and results. Its innovative design allows it to quickly acquire data from a wide range of wafers, including standard, flash, NAND, and flip chip units. The asset also allows for the testing of both single and multi-die wafers, producing results that can be used to verify process yields and optimize device production. DNS Lambda Ace VM-2200 is a reliable and powerful metrology and testing model that can be used to produce high-quality performance data for a variety of wafer types. Its advanced imaging equipment, powerful data processing system, and suite of analysis algorithms make it an ideal tool for any high-tech metrology and testing tasks.