Used DNS / DAINIPPON Lambda Ace VM-2200 #293664931 for sale

DNS / DAINIPPON Lambda Ace VM-2200
ID: 293664931
Wafer Size: 4"
Film thickness measuring system, 4".
DNS / DAINIPPON Lambda Ace VM-2200 is an advanced wafer testing and metrology platform designed to meet the ambitious needs of today's semiconductor industry. It is a modular system comprised of two main components; a wafer handling 'Probe Station' and a 'Metrology' module. The Probe Station is a vacuum-based system designed for testing and inspecting wafers up to 200 mm in diameter. It is capable of handling a wide range of materials including silicon and non-conformal substrates, with a maximum of 25,000 particles that can be tested for in a single scan. The station is also equipped with an integrated Multi-Wafer head, allowing up to 8 wafers to be tested and inspected simultaneously. The Metrology module is a rugged, high-precision metrology platform designed to measure electrical parameters with optimized flexibility for both Semiconductor and Microelectronic device testing. It includes a wide range of features such as advanced measuring and sorting technologies, 3D imaging, and repeatable calibration for high accuracy. DNS Lambda Ace VM-2200 is also compatible with a variety of software solutions, enabling multiple languages and multitasking capabilities. Its dual processor architecture maximizes scanning throughput while its automated module swapping ensures fast and accurate testing and measurement processes. With cutting-edge features and powerful capabilities, DAINIPPON Lambda Ace VM-2200 is an ideal solution for wafer testing and metrology.
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