Used DNS / DAINIPPON Lambda Ace VM-2200 #293664934 for sale

DNS / DAINIPPON Lambda Ace VM-2200 is an advanced wafer testing and metrology equipment, designed for ultra-precise analysis of wafers. This system features a highly precise high-resolution camera and a wide range of specialized lenses, allowing for the inspection of wafers down to micron-level resolution. The built-in alignment unit allows for fast and accurate placement of the wafer, and the dedicated CCD yields high-accuracy metrology measurements of both the wafer size and the thickness of individual wafers. The machine also features advanced measurement and analysis capabilities, including automated measuring systems that quickly and accurately measure characteristics such as critical dimension (CD), pitch, and surface profile. The tool can also generate a wide range of 3D images of the wafers, allowing for detailed analysis of wafer features and characteristics. The integration of specialized software makes analyzing results faster and easier, while the innovative usage of light sources helps improve the precision of the measurement results. The asset also features advanced software for calibrating and verifying results, and for running simulations. This allows for improved accuracy, and the ability to quickly detect errors. It offers flexible storage options, allowing users to store results in either an external hard drive or directly to the internal memory. In addition, the model can be easily connected to other systems, making it easy to transfer large amounts of data, such as images and metrology results. Overall, DNS Lambda Ace VM-2200 is an advanced wafer testing and metrology equipment, designed for powerful and precise wafer analysis. The high-resolution camera, specialized lenses, and a wide range of measurement and analysis capabilities allow for quick and accurate wafer evaluation. The advanced software and flexible storage options provide users with a comprehensive solution for analyzing and storing results. This system will provide years of reliable performance for those conducting wafer testing and metrology.