Used DNS / DAINIPPON Lambda Ace VM-2200 #293664935 for sale

DNS / DAINIPPON Lambda Ace VM-2200 is a wafer testing and metrology equipment designed for advanced metrology from wafer to die level. With the advancement of the semiconductor process, the ability to measure pattern features at nanometer and ten nanometer levels are consistently required. The VM-2200 is an integrated testing and metrology system that meets this demand. The unit's optical layout is based on a superfast laser scanning machine, providing the highest in survey speed and accurate test results. The platform is compatible with various types of wafers, including Silicon, GaAs and TIMS (a type of thin film semiconductor). The tool has a large capacity, consisting of two stages, four ports, and a high-end image processor. This configuration allows for multiple wafers to be tested simultaneously. The high-end processor is capable of handling complex image data quickly. This is in contrast to traditional scanning wafer microscopes, which require individual image analysis with a slower processor. The image acquisition speed is also much faster due to the laser-based asset. The VM-2200 also has a specialized software suite for metrology and optical inspection. The software allows for efficient analysis of wafer data, as well as adjustments in test parameters. This software allows the user to fine-tune the model for each application. Additionally, the software also provides an interface to analyze the data in real-time and generate automated reports. Additionally, the equipment is equipped with advanced features that provide a high degree of control and precise measurements. These features include an integrated scatterometer, enabling accurate measurement of line width and line step, as well as a phase shift interferometer, which is for measuring thickness of thin films. Additionally, the system includes an automated alignment unit that quickly and precisely calibrates the machine for each application. DNS Lambda Ace VM-2200 is the ideal tool for high speed and high accuracy measurement of wafers. With its sophisticated features and its intuitive user interface, the VM-2200 is the ideal choice for advanced metrology applications at nanometer and ten nanometer levels.