Used DNS / DAINIPPON / SCREEN WS-8200 #9384147 for sale

DNS / DAINIPPON / SCREEN WS-8200 wafer testing and metrology equipment is an advanced technology platform used in semiconductor and flat-panel display manufacture. It uses a proprietary non-contact optical inspection method to check for defects before, during, and after the fabrication process. At the heart of the system is a state-of-the-art 2D and 3D non-contact optical inspection unit. It is capable of accurately measuring shapes, irregularities, defects, and scattered light from the sample surface and analyzing them in real-time for on-the-fly defect detection. It also offers a wide range of parallelization capabilities that allow sampling and inspection rates to be optimized to meet customer needs. The machine also uses several advanced technologies such as a proprietary N-beam illumination tool which provides a wide range of diffraction and scattering shapes to detect defects. Advanced non-contact optical inspection systems (ONCIS) are used to detect these defects in real-time and with very little sample destruction. The asset also uses a suite of coordinate measurement and metrology techniques to analyze the surface profile of the sample for defects and irregularities. The 3D non-contact optical inspection and metrology model can also be used to measure topographies and three-dimensional characteristics such as height, depths, widths, slopes, and surface profiles among others. This facilitates rapid first-article testing and similar checks which eliminate the need to process physical samples and helps save time and money. DNS WS-8200 is also equipped with an automated laser scanning microscope that measures physical parameters and assists in the localization of defects. This helps optimize inspection throughput, reduce false positives, and allows for more accurate measurements that can be used for analysis and diagnostics. SCREEN WS-8200 also offers a variety of software tools to analyze defect images in real time. This data can then be used to optimize process parameters for defect reduction and line yield improvement. Additionally, the equipment offers a comprehensive set of video and image tools to monitor device characteristics during operation, thus allowing quality control decisions to be made early. Overall, WS-8200 wafer testing and metrology system is an advanced technology platform used in semiconductor and flat-panel display fabrication that combines a wide range of non-contact optical inspection and metrology techniques with an array of software tools to help improve line yield, reduce false-positives, and minimize the need for processing physical samples.