Used DNS / DAINIPPON VLM 800LS #188558 for sale
DNS / DAINIPPON VLM 800LS Wafer Testing and Metrology Equipment is an advanced machine for automated form factor measurements and materials testing of semiconductor wafers. This system can be used in a variety of inspection tasks for wafer metrology, including measuring wafer thickness, bow, warp, and various surface parameters. The unit consists of an ergonomically designed control console, measurement heads, a main computer, and powerful software for programming and measurement control. The control console houses the display, control panels, and main computer that enable users to interface with the machine for programming and measurement control. The DVM800 LS tool can work with various types of non-contact measurement heads, such as eddy current, white-light interferometry, and photography heads. This allows the asset to measure wafer thickness, bow, warp, and other parameters. The main computer of the model is used for programming, measurement control, and data communication. This computer also runs powerful software that enables users to set up and program the measurement parameters and accurately monitor and control the equipment's performance. The software also saves test data for analysis that can be downloaded to a host PC for further analysi. The measurement heads are equipped with advanced optics, lasers, and lenses for precise and high resolution measurements. The main computer is connected to the head for data acquisition and control. The system can measure features such as step-height, end-point, peak-to-valley, total-index, and run-out with high accuracy. Additionally, the unit can mesh and measure large area products such as flat-panel displays in a short amount of time. Finally, the machine also features safety features such as motion monitoring, lockout/tagout, and E-Stop that prevent accidents and keep operators safe. Overall, DNS VLM 800LS Wafer Testing and Metrology Tool is a highly advanced and reliable machine for automated form factor measurements and materials testing of semiconductor wafers. The asset features an ergonomic design, powerful software, advanced optics, and safety features that make it an ideal choice for wafer metrology tasks.
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