Used DNS / DAINIPPON VM-2010 #9210340 for sale

ID: 9210340
Wafer Size: 8"
Thickness measurement system, 8".
DNS / DAINIPPON VM-2010 is a wafer testing and metrology equipment used for assessing the condition of semiconductor wafers in the manufacturing process. This system utilizes Daikin's advanced technologies such as vision, image sensor technology, and high precision flatness / roughness measurement to identify defects during the wafer manufacturing process. DNS VM-2010 is equipped with an eight-axis motion control unit with both linear and angular motion capabilities. It includes multiple imaging cameras and a 3D contour detection machine to detect and quantify wafer defects in real time. Its advanced wafer inspection algorithms can quickly and accurately identify defects for immediate process improvement. The tool is designed for easy operation. A user-friendly graphical user interface enables fast manual or semi-automatic feature recognition while color-coded illustration graphics provide a visual representation of the wafer surface. Additionally, DAINIPPON VM 2010 includes a variety of data and statistical analysis capabilities to monitor process stability and consistency. VM-2010's high accuracy metrology capabilities promote high yield production of high performance wafers. It carries out surface measurements including both flatness/roughness and depth/contours with a resolution down to 0.2 nm. It also enables direct determination of dopant distribution homogeneity without requires complicated calculations. With its quick throughput time and powerful analysis capabilities, DNS / DAINIPPON VM 2010 provides powerful analysis and fault diagnosis for improved wafer production yield. Its flexible architecture supports a variety of industry-standard software interfaces, allowing for efficient integration of the asset into existing production environments. All in all, DNS VM 2010 is an essential tool for high quality wafer production.
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