Used DNS / DAINIPPON VM-2010 #9374929 for sale

DNS / DAINIPPON VM-2010 is a cutting-edge wafer testing and metrology equipment designed by DNS for advanced IC and MEMS wafer testing and evaluation. The system is capable of offering both automated and manual analysis for wafer test and metrology, allowing users to quickly assess wafer conditions in order to perform analysis and prepare information. It's an all-in-one platform integrating the up-to-date sample handling, automation, image acquisition and analysis, wafer and mask test, unit calibration, and more. The machine requires software to communicate with the hardware interfaces and execute the commands for sample handling and measurement. The embedded software is perfect for the implementation of the tasks and gives users reliable, automated, repeatable, and programmable control to achieve the highest accuracy. The tool consists of a mainframe with integrated microscope, wafer handlers, metrology modules, lens controller, sample stage, image processing hardware, and probe cards. The integrated microscopes are equipped with bright field or dark field objectives, enabling users to clearly identify the patterns on the wafer. This helps to test any irregularities on the wafers. Wafer handlers provide precision wafer handling and enable a wide range of sample positioning functions. Furthermore, these can be linked with the metrology module to quickly and accurately measure the characteristics of the samples. These modules are compatible with the range of possible metrology techniques such as laser microscopy, image processing, and various lithography methods. The specialized lens controllers allow users to precisely assess the wafers. Images acquired using the lens controller are highly accurate and also enable users to evaluate adjacent wafers without manual operation. Apart from the hardware, DNS VM-2010 also features software to help users assess the wafer conditions and evaluate differences in terms of measurements. The software is flexible and can be used for multiple purposes such as asset calibration, recipe management, data analysis, etc. Thanks to its advanced features, DAINIPPON VM 2010 offers reliable, repeatable, and programmable tests and metrology for any wafer. As such, it is the perfect solution for wafer testing and evaluation. It also offers great accuracy and sample handling control, allowing users to quickly assess wafer conditions and analyze data.