Used DNS / DAINIPPON VM-2010 #9399111 for sale

DNS / DAINIPPON VM-2010 is a wafer testing and metrology equipment designed for semiconductor manufacturers. It uses sophisticated optical, electrical and chemical measurements to assess a range of semiconductors, including transistors, contacts, and interconnects. The system performs a variety of tests, including on-wafer parameter measurements, wafer level testing, wafer surface metrology, and defect inspections. For parameter measurements, the unit uses a combination of phase-shifting interferometry, bright field imaging and voltage techniques. Electrical measurements are able to be performed without any contact to the wafer, which allows for highly accurate results. The machine is highly precise and allows for both qualitative and quantitative analysis. The ability to measure and record qualitative parameters, such as color and texture, gives manufacturers a comprehensive view of the characteristics of their products. For wafer surface metrology, DNS VM-2010 uses an automated sampling tool to measure topographic parameters of the wafer. This allows for surface roughness, tilt measurement, and line width. The asset is able to detect defects on the wafer surface, even defects as small as the width of one micron. The model is also capable of wafer level testing, which involves measuring and characterizing entire structures on the wafer. This is done by exposing the structures to chemical and electrical protocols, then measuring parameters such as current density, density of states, and time constants. DAINIPPON VM 2010 offers manufacturers a wide range of tests and measurements. It provides highly accurate, reliable data that can be used to make informed decisions on the design and manufacturing of semiconductor products. The equipment also offers a low-cost solution for manufacturers who need to stay competitive in a fast-paced industry.