Used DORIAN P499 #9396152 for sale

DORIAN P499 is an advanced wafer testing and metrology equipment, designed for applications such as integrated circuit inspection and process analysis in the semiconductor industry. It offers users a comprehensive solution for automated visual inspection, defect imaging and electrical characterization, without compromising on accuracy and precision. The system offers an integrated hardware and software experience that enables users to quickly set up their integrated circuit test sequences, analyze results, and take the necessary corrective measures to optimize their process operations. P499 features an ultra-fast CCD imaging unit that is capable of performing high-precision visual inspection of integrated circuits on the wafer multiple times faster than traditional wafer inspection tools. It also offers high-speed electrical probing capabilities that enable users to capture exact parameters about their device's electrical characteristics with great accuracy. In addition, the machine includes a Defect Review Module (DRM), which accurately detects, displays and classifies surface defects in a single click. The tool's advanced data analytics capabilities allow users to discover relationships between various physical and electrical characteristics of their integrated circuits and the underlying process that produced them. This allows them to quickly identify process optimization opportunities, and take the necessary corrective measures. DORIAN P499 runs on a Windows-based platform for intuitive operation and rich analysis of test data. It includes a Graphing and Analysis Module (GAM), which enables the user to easily generate colorful and comprehensive graphs that help illustrate the relationship between the various characteristics of the device. The asset also features an extensive built-in database for storing device data, as well as interactive visual tutorials which help users quickly set up their test sequences and study results. Overall, P499 offers an exceptional experience that is rarely found in such an advanced wafer testing and metrology model - allowing users to quickly analyze and optimize their process operations in the most accurate and efficient manner possible.