Used E+H METROLOGY MX 203-8-37-Q #9234105 for sale

The E+H METROLOGY E+H METROLOGY MX 203-8-37-Q is a highly sensitive and precise wafer testing and metrology equipment specifically designed for use in semiconductor process engineering. It features a rugged design with a glossy black finish, a display module for the user interface, and a layer electrometer system with 8 axes/sensors for testing/measuring different parameters. Additionally, it is engineered to provide extraordinary accuracy and repeatability for a wide range of wafer testing and metrology measurements. The METROLOGY MX 203-8-37-Q is capable of testing integrated circuits up to 8 inch wafer scale. It includes sophisticated software programs that allow users to analyze and manage a variety of different wafers, substrates, and diodes, as well as program specific parameters. In addition to its testing capabilities, the METROLOGY E+H METROLOGY MX 203-8-37-Q also offers a range of powerful calibration, diagnostic, and analysis functions. It has a multi-axis feedback unit and a calibration resolution of 1000 A/D steps. This ensures optimal accuracy and repeatability for a variety of different measurements. The METROLOGY MX 203-8-37-Q is designed to meet the exacting requirements of the semiconductor industry. It is constructed with a durable, non-reflective aluminum body to protect the sensitive components from the environment. It is also capable of handling temperature variations from 25°C to 80°C, and varying vibration levels. Additionally, to ensure maximum safety and protection, it is equipped with a number of built-in safety systems such as fire suppression devices and electromagnetic interference filters to restrict EMC radiation. Overall, the E+H METROLOGY E+H METROLOGY MX 203-8-37-Q is a highly efficient, precise, and reliable wafer testing and metrology machine designed to provide reliable results. Its robust construction, built-in safety systems, and range of versatile features make it an ideal choice for a wide range of semiconductor process engineering applications.