Used E+H METROLOGY MX 204-8-37-Q #9234108 for sale

The E+H METROLOGY E+H METROLOGY MX 204-8-37-Q is a powerful, automated wafer testing and metrology equipment designed to deliver precise measurements while providing the flexibility to conform to the most demanding applications. At the heart of the system lies an advanced 8-channel, 37-channel integrated test and metrology station. The unit provides high accuracy and reliability through a reliable, CCD-based optical machine. MX 204-8-37-Q offers exceptional repeatability, utilizing fast scan and process control algorithms. The machine can be used to characterize a wide range of parameters, such as critical dimension, flatness, and CD uniformity, of a variety of device structures. The tool can also efficiently measure the topology of advanced devices, enabling process optimization and improved wafer yield. Its 50kHz laser scanning offers an unprecedented level of fast tracking, with an exceptionally wide dynamic range and very low shot noise levels. This asset is ideal for applications such as scanning electron microscopy, AFM/SPM, and particle-in-cell (PIC) secondary electron imaging. E+H METROLOGY MX 204-8-37-Q also features a multi-mode operation that supports multiple wafer testing and measurement methods (e.g., dynamic non-contact sensing, scanning, and imaging). In addition, the model offers a range of options to simplify operations, providing a wide range of functionality that allows users to configure the equipment according to their needs. The system leverages advanced technology to provide the highest efficiency, accuracy, precision, and repeatability. MX 204-8-37-Q is equipped with an intuitive user interface, allowing users to easily control the unit without requiring any expertise in machine programming. It utilizes LabVIEW software to provide users a high degree of flexibility and efficiency in setting up the tool. In conclusion, the E+H METROLOGY E+H METROLOGY MX 204-8-37-Q is an automated wafer testing and metrology asset that offers excellent precision and accuracy with a high degree of flexibility, enabling users to configure the model to suit their own unique needs. Its 50kHz laser scanning technology, dynamic non-contact sensing, and imaging modes provide an efficient and reliable measurement solution. The user-friendly interface and intuitive software further ensure fast and easy setup and operation.