Used E+H METROLOGY MX 204-8-37-Q #9234109 for sale
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ID: 9234109
Vintage: 2007
Wafer measurement system
Square / Pseudo-square: 125-156 mm
Gauge type: MX 204-8-25-q
Thickness range: 200 - 600 μm
Real: 180 - 600 μm
CE Marked
2007 vintage.
The E+H METROLOGY E+H METROLOGY MX 204-8-37-Q is a fully automated and self-contained wafer testing and metrology equipment designed for rapid analysis of wafers and other substrates. This innovative system utilizes specialized hardware and software to measure topography, thickness, etch depth, electrical properties, and other features of wafer substrates with unsurpassed accuracy and repeatability. The unit is comprised of a multi-axis gantry machine that supports a range of measurement tools tailored to a wide variety of wafer materials and applications. Pressure and temperature controlled gas cabinets provide a stable and thermally controlled testing environment, ensuring that the accuracy and repeatability of multiple measurements are not compromised by environmental conditions. The tool can perform Automatic Feature Recognition (AFR) and other advanced measurements using an array of tools such as optical profilers, interferometers, and electrical inspection systems. AFR automatically detects changes in surface features based on digital imaging and algorithms and can measure more than 50 parameters including surface roughness, etch depth, thickness, and various electrical properties. The software package is capable of handling the entire measurement process from pre-measurement setup to post-processing and reporting. It can automatically acquire, store, and process data from multiple tools and analyze the data to detect trends. This allows for quick identification of production issues, eliminating the need for tedious manual review and analysis. The ergonomic design of the asset and its software makes setup, operation, and maintenance fast and easy. The motor-driven wafer handling model is also capable of performing fast measurements on about 500 wafers per hour. The E+H METROLOGY MX 204-8-37-Q is an ideal solution for semiconductor device manufacturers that require high-precision, repeatable performance for testing. It is also cost-effective, making it a great investment for any production environment.
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