Used EPIPLUS / ETAMAX LIF-100 #9180604 for sale

EPIPLUS / ETAMAX LIF-100 Wafer Testing and Metrology Equipment is an advanced, fully automated wafer testing and metrology solution for the semiconductor industry. It is designed to provide reliable and accurate analysis of physical, electrical, and optical properties of wafers. The system features the latest in high-precision imaging and analysis technologies, and can be used to analyze wafer patterns down to the sub-micron level. ETAMAX LIF-100 is designed for efficient and accurate measurement of wafer surface characteristics. It can measure a variety of parameters, such as linewidths, pattern area, dimensions, and surface bumps. It is also equipped with a fully integrated dark marking unit for fast and accurate measurement of linewidths and other features. The machine is capable of measuring wafers from 1 to 12 inches in size, with a resolution of 1 micron. EPIPLUS LIF-100 is powered by a powerful controller that can process over 20 million data points per second. This enables the tool to quickly analyze wafer patterns and determine physical and electrical properties. In addition, LIF-100 can measure the thickness of thin-film layers using its integrated impedance meter. This enables accurate and reliable layer analysis and process control. EPIPLUS / ETAMAX LIF-100 also features a user-friendly software interface, allowing for easy setup and operation of the asset. It is equipped with data acquisition hardware and software for automated data acquisition and analysis. Additionally, the software can provide statistical analysis with customizable graphics to provide operators with the information they need to make informed decisions. ETAMAX LIF-100 is also designed for easy setup and operation. It includes an integrated sample stage and color touchscreen interface, and can be integrated with automated metrology systems. It is designed for rapid tune sensing and setup, and is equipped with automated vacuum robots for precise handling and transport of samples. This helps expedite the workflow and improve sampling accuracy. EPIPLUS LIF-100 Wafer Testing and Metrology Model provides high-precision and reliable analysis of integrated circuit wafers and materials. The equipment is designed for accuracy, speed, and convenience, and helps to improve testing times, reduce costs, and improve accuracy and reliability in the manufacturing process.