Used ETAMAX Unimap #293655590 for sale

ETAMAX Unimap is a fully automated wafer testing and metrology equipment designed to help your business meet the industry-wide demands for highly reliable wafer testing and metrology. The innovative technology of Unimap is designed to provide maximum productivity and flexibility while achieving unmatched accuracy and reliability. With the ability to measure a wide variety of wafer types and features, ETAMAX Unimap offers both productivity and precision in a single system. Unimap unit is based upon a modular concept which allows for essential functionality and upgradability. The standard machine comprises of the mainframe, a wafer handler and stage module, an alignment head module and the measurement head module. To measure thin-film devices, the tool supports eight prober heads, eight optical modules, as well as five electrical probing modules. Optional components include laser interferometers, mechanical stages, advanced optical systems, and defect review systems. This asset is designed to provide the most efficient and precise measurements possible and is controlled by an advanced software package. ETAMAX Unimap software package runs on Windows NT/2000 and is user friendly with its customizable menus and helpful tutorials. This intuitive program brings together graphical, tactile, and textual information into one visual user interface and simplifies the setup of measuring programs to reduce overall time and improve accuracy. When operating, Unimap provides excellent repeatability and repeat capacity. The advanced mechanical stages ensure accurate and repeatable alignments to the most intricate features on a wafer. The combination of these stages with the capabilities of the optical and electrical probing sets ETAMAX Unimap device apart from its competitors. The model also offers comprehensive metrological analysis allowing users to measure a wide range of parameters from critical dimensions (CD) to overlay, and numerous other parameters. Unimap stands out from its competitors in providing automated functions for defect review and sample sorting. These features reduce the time needed for complete wafer production inspection, allowing the overall process to be accomplished more quickly with less manual labor. Furthermore, ETAMAX Unimap is highly adaptable to changes in production needs. By adding or subtracting probers, optical, and electrical probing modules, the equipment can be upgraded or modified quickly and easily. Overall, Unimap offers the highest standard of wafer testing and metrology and is sure to exceed customers' expectations for precision and productivity. With its flexibility and superior accuracy, this system is an excellent choice for businesses in need of reliable testing solutions.