Used EV GROUP / EVG EVG 40NT #293648725 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
![EV GROUP / EVG EVG 40NT Photo Used EV GROUP / EVG EVG 40NT For Sale](https://cdn.caeonline.com/images/ev-group-evg_evg-40nt_78499856.jpg)
![Loading](/img/loader.gif)
Sold
EV GROUP / EVG EVG 40NT is a fully-integrated wafer testing and metrology equipment capable of measuring devices with sizes ranging from 12- to 200-mm. This system offers a host of advanced features, including non-destructive wafer testing, physical measurement electronics and micro-metrology capabilities. For wafer testing, the unit utilizes a wide range of technology resources to facilitate nanometric analysis of parameters such as: resistance, capacitance, voltage, current, temperature and charge. The machine is capable of automatically specifying test points, controlling the frequency and amplitude of signals, and provides direct readouts of measurement results. It employs sophisticated optical real-time imaging and overlay systems to assess the performance of heterogeneous devices and components. In order to provide high accuracy micro-metrology capabilities, the tool employs a unique strain-gauge like technology based on laser interferometry. This technique enables direct measurement of distortion in nano-scale structures, allowing direct visualization of local structural parameter variations. Additionally, high-precision imaging and optical analysis are used to measure ultra-thin structures with sub-micron resolution. The asset can also perform nano-scale 3D topographical mapping of surface features with maximum resolution of 1.5 nm. The EV Group/EVG EV GROUP 40NT model is also equipped with software resources for a variety of statistical metrological analysis, such as descriptive statistics, clustering and classification algorithms. These resources allow for rapid characterization of complex devices and components, yielding an in-depth understanding of parameters such as process variation, yield optimization and defect inline reviewability. This equipment provides an efficient and easily-controlled platform for nanometric evaluation of devices and components in a wide range of industries. From advanced semiconductor components, to biomedical implants and optical components, EVG EVG 40NT is a powerful tool for the analysis of nanoscale structures and materials. This system is capable of supporting large-scale production runs, providing reliable and accurate measurements necessary for quality assurance. With its diverse capabilities and advanced technology, EV GROUP EVG 40NT is an invaluable asset to any modern engineering lab.
There are no reviews yet