Used FEI 300 #9386526 for sale

FEI 300 is a wafer testing and metrology equipment manufactured by FEI Company, one of the world's leading innovators in electron microscopy and lithography equipment. This system is the company's top-of-the-line metrology unit, designed to provide precise measurements of both the physical and electrical properties of wafer samples at nanometer scales. The machine is equipped to perform a wide range of testing procedures and analytical processes on dielectric, semi-conductive, and magnetic materials. 300 provides a complete range of metrology techniques, including high-resolution electrical measurements, physical/chemical analysis of samples, scanning and imaging capabilities, and various other processes. It features a powerful 5-axis stage which can accurately position the sample within 1 nanometer accuracy. The stage also features a tilt compensation feature allowing it to move freely without changing the orientation of the sample. The tool is equipped with a wide range of imaging tools, such as optical microscopes, electron microscopes, and x-ray diffraction microscopes. These enable users to study the physical structure of their samples in great detail. FEI 300 is also able to generate precise topographical maps of the sample's surface, even at nanometer levels. The asset also includes a powerful software suite, which allows users to analyze their samples in great detail. This suite includes a number of templates and wizards which enable the user to accurately measure a wide range of parameters within their samples, from surface roughness and film thickness to electrical properties. The software also includes an extensive library of materials, enabling users to compare and contrast samples and compare results. 300 is an incredibly powerful tool which can be used to accurately measure and analyze a wide range of materials. The model's robust instrumentation and powerful software capabilities make it an invaluable tool for scientists and engineers to measure and analyze the properties of wafer samples, with unprecedented accuracy and precision. This makes it an essential tool for any modern laboratory or engineer's arsenal.