Used FILMETRICS F20-NIR #293737711 for sale

FILMETRICS F20-NIR is a state-of-the-art wafer testing and metrology equipment designed to support the production, process control, and development of advanced semiconductors, optoelectronic and photonic devices. The system offers a combination of wafer texturing, focusing and contact angle measurement, offering ultra-fine resolution for a wide range of optical materials. The unit features a wide range of metrology capabilities, including 3-D calculations, image analysis, surface texture, and optical surface profiles. It also offers a wide range of unique test capabilities such as colorimetry, fluorescence, radiation and photo detection. With its advanced optical capabilities, F20-NIR is capable of characterizing patterned substrates with a resolution down to a few nanometers. The machine also offers a comprehensive range of spatial and temporal imaging solutions, enabling in-die defect inspection and analysis. FILMETRICS F20-NIR's optical capabilities are complemented with a powerful integrated software suite, providing a wide array of processing and analysis tools. The software provides a user friendly interface for capturing images, manipulating data, and manipulating optical components. The software also offers advanced algorithms for image enhancement, colorization, and longitudinal stress analysis. The tool also provides fast response times, with autofocus and autotracking speeds of up to 200 Hz. Its high speed enables detailed evaluation of surface topology, drift, and contact angles on both backscatter and surface images. F20-NIR asset is ideal for semiconductor device and wafer characterization applications such as overlay metrology, film thickness measurement, optical inspection, defect analysis, and surface profiling. Its flexibility and speed make it an ideal choice for wafer and device testing in a variety of industries, including optoelectronics, microelectronics, photonics, MEMS, automotive, and aerospace.