Used FILMETRICS F20-UV #293820561 for sale

The FilmTronics FILMETRICS F20-UV is an advanced wafer testing and metrology equipment designed for the most demanding wafer fabrication processes. It provides a combination of high speed, high sensitivity, and strong accuracy for measuring thin films up to 1 micron thick and can measure transparent films down to 0.08 microns thick. FILMETRICS F 20 UV offers a wide range of features including large dynamic range, ultra-high resolution, fast scan rate, and powerful analysis software for generating detailed surface topographical maps. It also features variable focal plane and stepper concept to ensure the highest accuracy. To ensure reliable results, F20-UV utilizes a unique surface metrology (SM) technique which combines a light microscope, spectrometer, and surface profiler to provide unprecedented accuracy over a broad range of applications. This technique uses the SMM's high-power lenses to illuminate a sample surface while the spectrometer measures the transmitted or reflected signal at multiple angle, to calculate the thin film thickness. The system can measure vertical and lateral dimensions, as well as oriented texture, such as stripe and notch widths. Its metrology software is able to analyze surfaces in 3D with modules for profile tropology and tilt angle analysis. The software suites also provide high-level data visualization, correlation of power dissipation, grain size and number and particle size. Furthermore, an integrated optoelectronic unit is available for further enhancing the analysis of surface topography. This machine is extremely valuable for measurements of optical constants and film thickness, as well as for providing microscopic images of the sample's surface. F 20 UV 's intuitive user interface offers easy-to-read displays and intuitive, step-by-step operation. The operator is able to store all the data collected, including maps and tables, into a fully secured database, allowing repeatable results on the same wafers. FILMETRICS F20-UV also comes with a variety of film sample holders to accommodate all types of substrates. Overall, the FilmTronics FILMETRICS F 20 UV is a dependable, robust, high-precision tool providing reliable measurements and analysis of thin films and surfaces. Its combination of speed, accuracy and resolution, along with its intuitive operation, make it ideal for rapid and reliable wafer metrology.