Used FILMETRICS F20 VIS #9254778 for sale

FILMETRICS F20 VIS is an advanced wafer testing and metrology equipment designed for precise analysis of thin films. Utilizing a cutting-edge combination of optical and acoustic techniques, this advanced testing system provides accurate information on the physical, optical, and electrical properties of thin films on semiconductor,dielectric and metal substrates. F20 VIS offers outstanding reliability, reproducibility and other advantages, including fast data acquisition, low noise floor and high accuracy. At the heart of the unit is a high-performance imaging module which enables a range of metrology capabilities. This module features a dual-fiber optic feed-in scanner, two digital cameras and a laser imaging machine with programmable line and spot intensity analysis. The tool also incorporates a low-noise linear photodiode array for fast, high contrast image capture. This module is further equipped with a scanning mirror for line and area imaging, as well as a motorized stage for automatic and manual sample movement. FILMETRICS F20 VIS also includes a range of software capabilities, tailored to the demands of wafer testing and metrology. This includes automated defect and feature analysis, coupled with a series of sophisticated analysis tools and algorithms. The software enables users to quickly determine time- and frequency-dependent film characteristics such as thickness, refractive index, electrical conductance and dielectric constant. The state-of-the-art software is intuitive, customizable and designed to generate accurate results in the shortest possible time. Overall, F20 VIS is an exceptional wafer testing and metrology asset, capable of measuring the physical and electrical properties of thin film materials with remarkable precision. This advanced model enables users to optimize their process or product quality, by quickly identifying and correcting any irregularities or defects. With FILMETRICS F20 VIS, manufacturers can benefit from a significant improvement in wafer quality, with resulting cost and time savings.