Used FILMETRICS F20 #293598404 for sale

FILMETRICS F20 is a wafer testing and metrology equipment designed to provide informative data on the properties of wafers in a reliable and efficient manner. It is suitable for use in both laboratory and manufacturing environments. The system consists of a centrally mounted FILMETRICS F 20 unit base that holds an optical microscope, a custom-configured automated stage, a high-sensitivity imaging machine, and a powerful computer with display. This tool is able to measure a wide range of critical wafer parameters with high levels of accuracy and repeatability. In order to acquire its data, F20 employs an automated wafer stage, which is capable of moving wafers across the entire surface of the microscope. This allows for rapid and accurate measurements across the entire wafer surface. The imaging asset utilizes a high-resolution camera that captures images of the sample at the highest level of detail. This imaging model is then combined with a processing engine that is optimized to analyze the images with fast and accurate results. F 20 equipment includes a multitude of powerful analysis tools, such as integrated surface plotting, 3-D imaging and analysis, automatic defect recognition, lens particle detection, Wafer Defect Review, and stress analysis. This array of features provides a powerful set of features to analyze wafer properties quickly and accurately. The system is designed with the user in mind. It incorporates a largely intuitive user interface that allows the user to quickly and easily set up the unit for different configurations, as well as to check the results in real-time for verification. The machine is able to maintain a log file of the user's settings and measurements, enabling the user to go back and replicate experiments. FILMETRICS F20 is a reliable, accurate, and powerful wafer testing and metrology tool. By utilizing a powerful imaging and analysis asset that is designed for accuracy and speed, FILMETRICS F 20 is able to provide consistent and reliable data on the properties on wafers quickly and easily.