Used FILMETRICS F20 #293749308 for sale

FILMETRICS F20
ID: 293749308
Thickness measurement system.
FILMETRICS F20 is a high-performance wafer testing and metrology equipment. It is specifically designed to measure thin-film parameters, such as thickness, optical constants, and refractive indices. The system consists of a 1,200mm focal-length beam expander, a 633nm HeNe laser, and a 200mm-diameter spherical lens. The unit has a resolution of 0.5μm and an accuracy of 0.01μm. The machine can measure center-of-smear and centerline thicknesses of thin films down to 50nm. FILMETRICS F 20 offers numerous features and capabilities. It has an advanced data acquisition tool that automatically acquires and stores data from up to eight wafers simultaneously. It also features a built-in wafer-mapping feature, which allows for rapid navigation of the wafer surface. Additionally, a color-coded mapping feature enables quick and accurate identification of thin-film areas on a wafer. The asset also features sophisticated software for data analysis and comprehensive reporting. Its advanced software makes possible the collection, presentation, and analysis of detailed thin-film thickness data. The data can be presented in graphical format, allowing for quick and easy interpretation. The software also allows for the creation of customized standard wafer maps and exam-related reports. F20 is user-friendly and easy to set up and operate. Its intuitive graphical user interface (GUI) allows users to quickly navigate and control the model. Additionally, its remote monitoring capabilities allow users to keep an eye on their equipment and respond accordingly to any changes in system performance or potential issues. Overall, F 20 is a powerful and reliable tool for thin-film analysis. With its advanced features, accurate measurements, and comprehensive analysis capabilities, it is an ideal choice for any research or commercial thin-film measurement application.
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