Used FILMETRICS F20 #293757497 for sale

FILMETRICS F20 is a wafer testing and metrology equipment designed to measure a wide range of surface characteristics. The system is capable of quickly, accurately, and cost-effectively examining a wide range of both metallic and non-metallic wafers. FILMETRICS F 20 unit combines top-of-the-line image analysis, imaging, surface plasmon resonance, film thickness, and profile measurement capabilities into a single machine. This machine is ideal for use in production processes where accuracy, speed, repeatability, and flexibility are essential components. F20 is equipped with a precision frame stage and two independent measurement axes. This two-axis design allows for significant versatility in measuring a range of geometric shapes and sizes, including very small samples. It also allows for repeatable, accurate measurements of different samples. The tool's integrated 8" optical microscope allows the user to get a clear view of samples before, during, and after measurement, thus further increasing the accuracy of results. F 20 uses Advanced Image Transforming technology, which is ideal for measuring the thickness and refractive index of both transparent and opaque materials up to 25 microns thick. A native resolution of 0.76nm ensures that FILMETRICS F20 can accurately distinguish amongst a variety of thicknesses, as well as accurately measure running lengths of materials. Furthermore, the asset's object detection algorithm and profiles measurement features are designed to accurately locate and measure the critical surface features necessary for complete analysis. FILMETRICS F 20 also provides a number of advanced features that increase both accuracy and performance. For example, the model includes multiple surface profiling algorithms, adjustable floor plane and nodal point mapping, and on-the-fly auto-calibration. The equipment also has an in-built thermal compensation mechanism, as well as an integrated environment compensation feature. This feature utilizes an onboard optical reader and laser power monitor to automatically adjust for environmental conditions, thus further increasing accuracy. In short, F20 is a highly versatile, incredibly fast and extremely accurate wafer testing and metrology system. It is the ideal solution for gaining true insight into surface characteristics with the highest possible resolution. Not only does the unit provide tremendous flexibility in testing a wide range of materials, but it also eliminates the need for several different machines, thus improving overall efficiency and productivity. In addition to being extremely accurate, F 20 also boasts an intuitive interface and is surprisingly easy to use. As such, it is well suited for both novice and experienced user alike.