Used FILMETRICS F20 #9180225 for sale

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ID: 9180225
Thickness measurement system.
FILMETRICS F20 is a wafer testing and metrology equipment that is used in semiconductor production. It is ideal for making precise measurements during the fabrication of various wafer based products. The system is designed to perform highly accurate wafer measurements, as well as evaluation of defect parameters, discontinuity parameters, and other critical characteristics. It is the ultimate tool for providing highly precise metrology and testing of wafers. FILMETRICS F 20 unit has a high-resolution camera and illumination to provide precise, real-time measurements. The highly sensitive optics enable auto-lens alignment and correction, allowing higher precision measurement results. The machine is compatible with various types of wafers, including silicon, germanium, and gallium arsenide. The tool offers multiple measurement modes, from simple topography measurements to highly targeted evaluations of specific parameters. It has a wide range of measurement options, including edge-to-edge, radial, line, point, and circle. The data obtained from the asset can be used to identify anomalies in the surface, such as defects and discontinuities. In addition to providing precise measurements, F20 wafer testing and metrology model also provides a variety of trace and overlay options. This can be useful for precise measurement of dimensions and other critical dimensions. Trace and overlay mode also provide precise visual and statistical analysis of the wafer. The machine is also compatible with various other software tools, such as software that can generate a precise surface map. The machine is equipped with an inertial navigation equipment that allows it to position itself accurately, without the need for calibration. It also features various safety features and sensors to detect motion and vibration, making it safe to use in a production facility. The system is also equipped with a range of inspection and imaging modes, allowing for a range of specialized analysis. F 20 wafer testing and metrology unit is an ideal choice for accurate measurement and evaluation of wafer-based products. Its combination of precision measurement, trace and overlay options, reliable safety features, and support of software tools make it a perfect choice for any production environment.
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