Used FILMETRICS F3 #293593195 for sale

ID: 293593195
Thickness measurement systems.
FILMETRICS F3 is a versatile wafer testing and metrology equipment designed for use in semiconductor manufacturing operations. The system offers fast, high-resolution imaging, versatile surface testing, and advanced statistical analysis, making it a valuable tool in today's advanced processes. F3 is a compact and highly automated unit, allowing for quick setup and efficient runtimes. Its flexible architecture allows for seamlessly integration with a variety of existing equipment and protocols. It has a large measurement area, allowing for the completion of all standard tests that are often required for semiconductor fabrication customers. Additionally, FILMETRICS F3 is capable of measuring small features or structures with resolution as low as 0.1 microns. F3 features a sophisticated imaging machine, enabling synchronized focused images and events, as well as automated correction processing and the ability to map relevant data points. The tool's built-in statistical analysis capabilities enable the comparison of wafer topographies after processing. In addition, FILMETRICS F3 is able to perform a variety of surface testing processes, such as electrical measurements, capacitance-voltage measurements, and scans for physical parameters. The asset is equipped with an integrated vacuum chuck to simplify alignment of scanned substrates, as well as a heated chuck for accurate testing of sensitive devices. F3 advanced metrology model offers a comprehensive suite of tools for semiconductor process control, allowing for precise characterization of wafer topographies, electronic devices, and other physical properties. When combined with automated data collection, the equipment provides a powerful solution for automated wafer and device testing.
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