Used FILMETRICS F50 #9396057 for sale

FILMETRICS F50 is a wafer testing and metrology equipment for use on a variety of thin film applications. It offers high speed and accuracy for the testing of a wide range of thin film properties. This system makes use of several advanced technologies, such as Thin Film Reflectance Spectrophotometry and Ellipsometry. The Thin Film Reflectance Spectrophotometry (TFRS) feature of FILMETRICS F 50 offers best-in-class accuracy down to less than 1 micrometers in thin film thickness measurement. It offers rapid, non-contact analysis over a wide range of wavelengths, and it can measure thin film thickness with an accuracy of better than 0.1%. This level of accuracy is multiple times better than other technologies, such as On-wafer scattering and transmission. In addition, F50 utilizes Ellipsometry to measure thin film parameters, such as refractive index and thin film thickness. It is suitable for a wide range of thin film applications, including glass, polymers and metals. The unit can measure thin film properties that are nontransparent and partially transparent, which provides extended utility to different materials. F 50 offers high signal-to-noise ratio, fast scan rates and enhanced resolution for the analysis of small features. It also incorporates a positive pressure environment for optimized signal-to-noise ratio and flawless scan performance during environmental disturbances. With its data acquisition speed, the machine can acquire up to 500 spectra per second, allowing for real time data analysis. The tool can scan area from 0.2mm2 to 840mm2 and works in accordance with the highest level of calibration standards. FILMETRICS F50 is a versatile asset and can be used for many different tasks, such as evaluating the uniformity and stability of thin film deposition processes and measuring sheet resistance, optical properties and dielectric constants. It provides optimal accuracy, speed and reliability with minimal operator input.