Used FILMETRICS F50R #9396056 for sale

FILMETRICS F50R Wafer Testing and Metrology Equipment is a highly advanced, semiconductor equipment designed to perform non-contact, non-destructive format measurements of thin-film patterns on wafers at the sub-micron level with impressive accuracy. It utilizes a high-precision, laser-based optical sensor to take rapid scans of measured wafer surfaces while compensating for motion errors due to imperfect flatness and wafer curvature. The powerful motorized XYZ stage further ensures a stable platform for consistent scans, improving the reliability of results. The included software, FJX-Scan, is easy to use and provides comprehensive data analysis and reporting capabilities. It is built to measure features on wafers such as line width, thickness, topography, height, and tilt angle. The software's high-contrast image processing algorithms also allow for accurate thickness measurements of multilayer thin-films. Additionally, the system is equipped with an integrated camera for snap-shot imagery that aids in specimen identification and traceability. The unit's core optics consists of a semiconductor-grade microscope lens along with an adjustable laser diode module that is tunable in both wavelength and power. With a 120 mm field of view and fast scanning speed (up to 44 μm/s), F50R is an excellent choice for high throughput applications. It has multiple magnification settings, up to x50, allowing for increased accuracy of measurements for industrial applications where precision is critical. Other notable features of FILMETRICS F50R include automatic pixel sizing, integrated 2D stitching, and peak detection algorithms. Many of the machine's features can be controlled from the included front-panel control pad, while some of the more advanced features, such as user-defined calibration data, can be controlled through external devices. The dimension of the tool is 335 x 389 x 309 mm, making it compact and suitable for many different working environments. Overall, F50R is an all-encompassing, cost-effective solution for accurate and efficient wafer testing and metrology. Its reliable performance, automated controls, and data reporting capabilities make it a great choice for any industrial or research application.