Used FILMTEK 2000M #9329120 for sale

ID: 9329120
Benchtop metrology system For NIKON Eclipse L200 Measurement spot sizes: <2µm NIKON LHS-H100P-1 Objectives: NIKON LU Plan 10x / 0.30, 50x / 0.55 CF Plan 100x / 0.73 VIEWERA TFT LCD Monitor, 17’’ DELL BOSTRO Desktop Joystick Stage, 8".
FILMTEK 2000M is a high-precision wafer testing and metrology equipment designed to quickly identify wafer defects. It features a unique multiple-format tray testing system, which supports up to 10 wafers (and up to 300 test sites) simultaneously and eliminates the need for manual object swap-out. 2000M boasts a variety of advanced wafer testing functions, including photoresist measurements, overlay measurements, film thickness measurements, autofocus, and critical dimension (CD) measurements. It can measure a wide range of wafer materials, including polysilicon, silicon-on-insulator (SOI), germanium, and aluminum. With a measurement range of 0.03 micron (2-micron resolution) and a linearity of 0.5%, FILMTEK 2000M has the accuracy needed for most wafer inspection and metrology tasks. 2000M supports a number of plugins, including a powerful data analysis package for wafer defect analysis. It is integrated with a comprehensive software suite, allowing users to develop and run a variety of custom tests and analyze results quickly. It also contains a 3D optical unit, achieving superior resolution and excellent image quality. The machine includes a touchscreen control panel with intuitive user-friendly menus and a display that offers an excellent overview of the wafer surface. Its advanced hardware and software architecture supports high imaging and measuring speeds, while its advanced signal-processing algorithms ensure accurate results. FILMTEK 2000M is designed for reliability in mission-critical applications. It features robust construction, vibration and shock-resistant components, and closed-loop servo-motor axis drives. It is also designed to handle a high degree of automation. The tool is whisper-quiet and the heat signature is virtually non-existent, ensuring user comfort during extended testing periods. 2000M is one of the most advanced wafer testing and metrology systems available. Its excellent performance and accuracy make it an ideal solution for a wide range of applications, from process development to leak testing to semiconductor wafer fabrication.
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