Used FORMULA HF-SOFT #9101878 for sale

ID: 9101878
Metrology testing system.
FORMULA HF-SOFT is a high-performance wafer testing and metrology equipment designed to provide a powerful and user-friendly measurement and inspection environment. The system integrates host computer and hardware interface into a single unit, providing the most advanced and comprehensive capabilities for wafer testing and inspection. It supports most common wafer sizes and is capable of handling up to 200 wafers at the same time. The unit offers a number of powerful features, including precise test and metrology systems, an array of integrated testing tools, advanced sample handling, and a sophisticated software architecture. The integrated hardware interface allows users to connect to high-end testing systems and external instruments. The machine can simultaneously process up to 8 samples of various sizes at up to 1 GHz of capture rate, and provides up to 10,000 sinusoidal oscillatory signals. The tool also provides a comprehensive suite of measurement tools, including optical interferometer, laser scatterometer, CCD imaging spectrometer, surface profilometer, and high-dynamic range metrology. The measurement and analysis methods used by HF-SOFT are easily configurable and can be adjusted to meet the requirements of the application, including defect reduction and process optimization. The asset's powerful software architecture provides an intuitive, user-friendly interface, and offers powerful data acquisition, analysis, and visualization capabilities. All user data is stored in an industry-standard database, allowing for the easy analysis and comparison of results. The software also provides a consolidated environment for product support, and includes an integrated data analytics engine for further analysis. In addition, the model integrates with a wide range of external devices, including SEMs, steppers, FTIR, and X-Ray systems for exhaustive testing and analysis. FORMULA HF-SOFT equipment also offers an integrated calibration and verification facility, as well as a convenient data archiving and backup system. Overall, HF-SOFT unit combines world-class performance, advanced features, and easy-to-use software to provide a powerful and flexible wafer testing and metrology solution. With its intuitive user interface, comprehensive measurement and analysis capabilities, and integrated hardware & software architecture, the machine is the perfect choice for those looking for a complete wafer testing and metrology solution.
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