Used FOUR DIMENSIONS 280 #293639176 for sale

ID: 293639176
Wafer Size: 6"
Four point probe resistivity measurement system, 6" 1995-1996 vintage.
FOUR DIMENSIONS 280 is a wafer testing and type of metrology equipment that is used to measure and test the integrity of semiconductor integrated circuits. This system is capable of building unique formulations and offerings to meet the needs of various customers. It features a number of different advanced and sophisticated technologies that allow for identification and testing of the performance of ICs. 280 unit is equipped with a movable high-speed optical stage that allows precise measurements and has a robust programming interface and automation capabilities. This machine also has an advanced full vision light microscope that includes beam scanners, programmable automated optical recognition and pattern recognition for precise measurements. This technology minimizes the possibility of defective electrical performance and provides precise measurements within a fraction of a micron. The tool also comes with a precise wafer-to-wafer registration asset that provides high accuracy with precise resolution and accuracy measurement. FOUR DIMENSIONS 280 also offers an integrated measurement tool that allows user to configure their own axis and surface measurements. Its measurement results can be displayed on a real-time graphic display interface with a high level of accuracy, resolution and precision. The model also comes with a state-of-the-art metrology software package that is designed to help users develop application specific defect analysis algorithms. This allows for an automatic aperture metric, defect evaluation and a variety of other automated operations. It also includes an integrated vector file measurement and vector editing package for vector trimming, vector comparison and fault tracing. 280 equipment is a comprehensive tool for the semiconductor industry. It offers precise measurements, automated defect analysis and vector processing capabilities that minimize the possibility of defects and allow for efficient production of reliable semiconductor products. Its performance, accuracy and precision is unmatched, providing users with an unsurpassed system for meeting the needs of their customers.
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