Used FOUR DIMENSIONS 280 #9287787 for sale

FOUR DIMENSIONS 280 is a high-precision, automated wafer testing and metrology equipment that provides a versatile solution to a wide range of production and engineering requirements. 280 (FDM-FOUR DIMENSIONS 280) system offers a variety of technologies designed to meet a broad range of wafer testing and metrology needs. It consists of a main unit which incorporates a laser scanner, a CMOS-APT (Contact Mode Overlay Measurement Unit with Active Pixel Technology) Substrates, a Vertex Prober, an XY rail machine, and a vision/computer tool. The integrated laser scanner provides quick and accurate sample alignment which is further enhanced by the advanced CMOS-APT substrate alignment. Additionally, the FDM-280 is equipped with contact-mode solutions for die-to-die superimposition measurements and is capable of detecting mid-range and fine-level overlays. The high-resolution Vertex Prober offers undistorted sampling and time-efficient analyses, while the XY rail asset enables faster sample positioning and repeat processes of data collection. Finally, the vision/computer model enables accurate image recognition and computer-assisted analysis. Furthermore, the FDM-FOUR DIMENSIONS 280 equipment has an array of features that optimize performance and reduce processing time. It is designed to deliver high-accuracy results in the shortest possible time. It has an easy-to-use user interface which facilitates efficient data acquisition. Additionally, it supports non-destructive analysis and offers multiple measurement options for easy adjustment and storage of process parameters. Overall, 280 is an innovative wafer testing and metrology system that provides users with a comprehensive solution for all their production and engineering needs. Highly accurate measurements, faster sample positioning, and efficient data collection and analysis are just some of the many benefits offered by this innovative unit.